2.
Physical Aspects of Electron Microscopy and Microbeam Analysis
by Siegel, Benjamin M., Beaman...
ISBN: 9780783734705
List Price: $151.30
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Proceedings of the International Congress on X-Ray Optics and Microanalysis, 8th
by Beaman, Donald R., Ogilvie,...
ISBN: 9780878121809
List Price: $65.00